ACTA AGRICULTURAE BOREALI-SINICA ›› 2005, Vol. 20 ›› Issue (1): 23-26. doi: 10.3321/j.issn:1000-7091.2005.01.005

Special Issue: Wheat Biotechnology

Previous Articles     Next Articles

QTL of Wheat Yield Traits in D Genome

LI Wen-cai, LI Tao, ZHAO Feng-tao, LI Xing-feng, WANG Hong-gang   

  1. Agronomy College of Shandong Agricultural University, Subcenter of National Wheat Improvement Center, Tai’an 271018
  • Received:2004-11-02 Published:2005-02-28

Abstract: The D genome of common wheat came from Aegliops taushii.In order to find the gene that can improve the yield trait of common wheat,the variation characteristic yield trait of BC1 from T.durum-Ae.Squarrosa amphidiploids and D genome from Aegliops tauschii common wheat Ph85一16 was analyzed. The result showed that chromosomes in affected yield trait of wheat significantly. Spike length,grain number each spike, spike number each plant and thousand grain weight of BC1were higher than that of Ph85一16.while,four main-effect QTLs affecting yield trait were QSI. sdau-SD associated spike length whose were detected by 130 SSR primer pairs of D genome,Meanwhich contribution was 31.58%,QPh. sdau-1D associated plant height whose contribution was 25.38%,QGs. sdau-SD associated grain number/spike whose contribution 44.65%and QTgw. sdau-3D associated thousand grain weight whose contribution was 61.62%.

Key words: Aegliops tauschii, D genome, Yield trait, Quantitative trait loci, SSR marker

CLC Number: 

Cite this article

LI Wen-cai, LI Tao, ZHAO Feng-tao, LI Xing-feng, WANG Hong-gang. QTL of Wheat Yield Traits in D Genome[J]. ACTA AGRICULTURAE BOREALI-SINICA, 2005, 20(1): 23-26. doi: 10.3321/j.issn:1000-7091.2005.01.005.

share this article