ACTA AGRICULTURAE BOREALI-SINICA ›› 2015, Vol. 30 ›› Issue (S1): 420-424. doi: 10.7668/hbnxb.2015.S1.076

Special Issue: Wheat Soil fertilizer

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Effects of Fertilization Application Depth on Senescence Characteristics of Flag Leaf after Anthesis and Yield of Dry-land Wheat

SUN Xiao-ran, SUN Lü, ZHAO Chang-xing, LIN Qi, LIU Yi-guo, MENG Xiang-xia, WANG Yue-fu, WANG Wei-hua   

  1. College of Agronomy and Plant Protection, Qingdao Agricultural University, Shandong Provincial Key Laboratory of Dryland Farming Technology, Qingdao 266109, China
  • Received:2015-10-20 Published:2015-12-28

Abstract: To provide a scientific basis for setting the proper fertilizer application depth of wheat in dry-land farming area of North China Plain,with winter wheat cultivar Jimai 22 as test materials,the experiment under the field condition was carried out on the effects of different fertilizer application depth (0,5,10,15 cm) by furrowing during spring jointing stage on senescence characteristics of flag leaf after anthesis and yield of dry-land wheat.The results showed that in the whole growth stage,POD and SOD activity in wheat flag leaves of each treatment were shown as W2 >W1> W3> W0,and MDA content was expressed as W0> W3> W1> W2,while soluble protein content was shown as W0 treatment lower than other treatments and W2 higher than other treatments during the whole growth stage after anthesis.This indicated that fertilizer deep application could improve POD and SOD activity,increase soluble protein content and inhibit MDA yielding of wheat flag leaves,thus delaying leaf senescence.Wheat yield of each treatment was shown as W2> W1> W3> W0,and the yield of W1,W2 and W3 were increased by 8.5%,14.0%,4.2%,respectively.Meanwhile,the yield between the W2 and W0 treatment showed the significant difference.It is perceived that the proper depth of fertilizer application was helpful to improve the yield of dry-land winter wheat,and the highest increasing yield among the treatments is the 10 cm depth of fertilizer application during jointing stage.

Key words: Fertilizer application depth, Dry-land wheat, Flag leaf, Senescence characteristics, Yield

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Cite this article

SUN Xiao-ran, SUN Lü, ZHAO Chang-xing, LIN Qi, LIU Yi-guo, MENG Xiang-xia, WANG Yue-fu, WANG Wei-hua. Effects of Fertilization Application Depth on Senescence Characteristics of Flag Leaf after Anthesis and Yield of Dry-land Wheat[J]. ACTA AGRICULTURAE BOREALI-SINICA, 2015, 30(S1): 420-424. doi: 10.7668/hbnxb.2015.S1.076.

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