Locating the Quantitative Trait Loci(QTL) of Wheat Yield-related Traits Based on SRAP Markers

doi:10.3969/j.issn.1000-7091.2012.05.014

Abstract

Abstract: Grain size and morphology influence the yield and milling quality of bread wheat.The objective of this study was to identify quantitative trait loci(QTL) controlling kernel traits in wheat.Using a F2 population derived from Chinese winter wheat varieties Xinong 817 and China spring,four agronomic traits of grain length(GL),grain width(GW),grain thickness(GT) and 1000-grain weight(TGW) were evaluated.Based on F2 population,a genetic map comprising SRAP markers and SSR anchor markers was generated.According to the genetic map and phenotypic data,quantitative trait loci(QTL) were located for these agronomic traits using the inclusive composite interval mapping(ICIM) method.A total of 50 QTLs involving 1A,2A,2D,3B,4B,4D,5D,6A,6D and 7A wheat chromosomes and 5 linkage groups were identified for these four traits.Among them,16,13,10 and 11 QTLs for GL,GW,GT and TGW were identified,respectively.In addition,15 genomic regions with plenty of QTLs were detected on 1A,2D,4D,5D,6A,7A and 4 linkage groups in this study.

Key words: Wheat yield-related traits, SRAP and SSR, Quantitative trait loci

CLC Number:

S512.1

LI Qing-feng, MA Shou-cai, WANG Zhi-jun, SHI Xiu-xiu, BI Xiao-jing, CHEN Xiao-wen, ZHANG Gai-sheng. Locating the Quantitative Trait Loci(QTL) of Wheat Yield-related Traits Based on SRAP Markers[J]. ACTA AGRICULTURAE BOREALI-SINICA, 2012, 27(5): 72-79. doi: 10.3969/j.issn.1000-7091.2012.05.014.

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http://www.hbnxb.net/EN/Y2012/V27/I5/72

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