摘要： 以50keVFe⁺和Cu⁺注入绿豆种子，应用扫描电镜和X-射线能谱分析法观察、分析低能重离子的注入对绿豆种子细胞形态的影响及注入离子的穿透能力。结果表明，Fe⁺和Cu⁺注入后的种皮表面细胞壁角质层被破坏，细胞表面呈现出许多孔洞；剥去种皮的子叶和胚根表面，细胞壁明显塌陷；注入离子可穿过种皮，进入胚细胞。

关键词: 绿豆, 离子注入, Fe~＋, Cu~＋, 扫描电镜

Abstract: The seeds of mung bean were irradiated by iron and copper ion beam with energy 50 keV.The effects on cellular morphology of the seeds were observed by a scanning electron microscope, and the irradiating ability of the ions was analyzed by means of a scanning energy dispersive analysis of X-ray.The results showed that after the treatments with copper and iron ion beam irradiation, the cuticle layers of the cell wall in the surface of seed coat were destroyed, and the many holes existed in the cell surface;the cell wall was obviously subsided in the surface of cotyledon and the radicle with seed coat removed and that the ions could penetrate the seed coat and arrive in the embryo.

Key words: Phaseolus radiatus L., Ion irradiation, Fe+, Cu+, Scanning energy microscope