Development and Application of High Efficiency KASP Markers of Wheat Fusarium Head Blight Resistance Genes Based on High Throughput Chip
DENG Qingyan, LUO Jiangtao, ZHENG Jianmin, PU Zongjun
Acta Agriculturae Boreali-Sinica . 2025, (4): 175 -184 .  DOI: 10.7668/hbnxb.20195775