基于高通量芯片的小麦抗赤霉病基因高效KASP标记开发和育种应用
邓清燕, 罗江陶, 郑建敏, 蒲宗君
Development and Application of High Efficiency KASP Markers of Wheat Fusarium Head Blight Resistance Genes Based on High Throughput Chip
DENG Qingyan, LUO Jiangtao, ZHENG Jianmin, PU Zongjun
华北农学报
.
2025, (4): 175
-184
.
DOI: 10.7668/hbnxb.20195775
